DocumentCode :
2955962
Title :
Modeling and analysis of a new product development in electronic sub-assembly manufacturing
Author :
Joseph, Leo A. ; Watt, Jeffrey T. ; Wigglesworth, Nancy
Author_Institution :
Digital Equipment Corp., Tewksbury, MA, USA
fYear :
1990
fDate :
9-12 Dec 1990
Firstpage :
899
Lastpage :
903
Abstract :
The authors discuss the use of simulation modeling in the analysis of a process technology in electronic subassembly manufacturing to support the formulation of assembly, test, and repair strategy for volume manufacturing. The emphasis of the model is on the performance of the process from a capacity and quality standpoint. The study highlights the impact of defects (material and process) in parts per million, and manufacturing process strategy on throughput, work in process, cycle time, process yield, and defect escapes. A modular approach to simulation modeling is described. In this approach, users specify the characteristics (e.g., repair time) of a particular process step at a high level within the modular code. The modular code then translates this characteristic into the simulation code needed to represent that characteristic. The modular approach allows for quick and easy model development without repetitive code writing
Keywords :
digital simulation; electronic equipment manufacture; manufacturing data processing; production control; cycle time; electronic sub-assembly manufacturing; manufacturing process strategy; new product development; process yield; repair strategy; simulation modeling; throughput; volume manufacturing; work in process; Analytical models; Assembly; Computer aided manufacturing; Costs; Electronic equipment manufacture; Electronic equipment testing; Manufacturing processes; Product development; Pulp manufacturing; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference, 1990. Proceedings., Winter
Conference_Location :
New Orleans, LA
Print_ISBN :
0-911801-72-3
Type :
conf
DOI :
10.1109/WSC.1990.129633
Filename :
129633
Link To Document :
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