Abstract :
The following topics are dealt with: fault tolerance; VLSI systems; VLSI defects; BIST generation; on-chip test generation; emerging technologies; error detection; yield analysis; yield dependability; test design; and error correction.
Keywords :
VLSI; built-in self test; error correction; error detection; fault tolerance; integrated circuit testing; integrated circuit yield; BIST generation; VLSI defects; VLSI systems; emerging technologies; error correction; error detection; fault tolerance; on-chip test generation; test design; yield analysis; yield dependability;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-0-7695-3839-6
