Title :
A high accurate test standard of ADC, DAC and its experiment results
Author :
Tong Guangqiu ; Zhang Xiuzeng ; Zou Benxia ; Qian Zhongtai ; He Qiang
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
An automatic test standard of the static properties of ADC and DAC and its constituted technology are introduced. With some special techniques, we made a 24 bits inside standard DAC. The test speed can be from 40 Hz/spl sim/25 kHz. The measurement results are also submitted.
Keywords :
analogue-digital conversion; automatic test equipment; automatic test software; calibration; digital-analogue conversion; measurement standards; 24 bit; ADC; DAC; automatic test standard; combined feedback amplifier; computer control; high accurate test standard; linearity error; self-calibration; static properties; Automatic testing; Circuit testing; Control systems; Instruments; Interference; Isolators; Linearity; Microcomputers; Power system stability; System testing;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699955
