• DocumentCode
    2956029
  • Title

    What an image reveals about material reflectance

  • Author

    Chandraker, Manmohan ; Ramamoorthi, Ravi

  • Author_Institution
    Univ. of California, Berkeley, CA, USA
  • fYear
    2011
  • fDate
    6-13 Nov. 2011
  • Firstpage
    1076
  • Lastpage
    1083
  • Abstract
    We derive precise conditions under which material reflectance properties may be estimated from a single image of a homogeneous curved surface (canonically a sphere), lit by a directional source. Based on the observation that light is reflected along certain (a priori unknown) preferred directions such as the half-angle, we propose a semiparametric BRDF abstraction that lies between purely parametric and purely data-driven models. Formulating BRDF estimation as a particular type of semiparametric regression, both the preferred directions and the form of BRDF variation along them can be estimated from data. Our approach has significant theoretical, algorithmic and empirical benefits, lends insights into material behavior and enables novel applications. While it is well-known that fitting multi-lobe BRDFs may be ill-posed under certain conditions, prior to this work, precise results for the well-posedness of BRDF estimation had remained elusive. Since our BRDF representation is derived from physical intuition, but relies on data, we avoid pitfalls of both parametric (low generalizability) and non-parametric regression (low interpretability, curse of dimensionality). Finally, we discuss several applications such as single-image relighting, light source estimation and physically meaningful BRDF editing.
  • Keywords
    image processing; regression analysis; homogeneous curved surface; image processing; material reflectance; semiparametric BRDF abstraction; semiparametric regression; Brain models; Estimation; Light sources; Materials; Parametric statistics; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision (ICCV), 2011 IEEE International Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4577-1101-5
  • Type

    conf

  • DOI
    10.1109/ICCV.2011.6126354
  • Filename
    6126354