DocumentCode :
2956043
Title :
Multi Gbit-scale partially frozen (PF) NAND DRAM with SDRAM compatible interface
Author :
Fujino, T. ; Arimoto, K.
Author_Institution :
ULSI Lab., Mitsubishi Electr. Corp., Hyogo, Japan
fYear :
1998
fDate :
11-13 June 1998
Firstpage :
96
Lastpage :
99
Abstract :
In order to realize Gbit-scale DRAM in a small chip size, the NAND DRAM cell is a good candidate, however, open bit line (BL) arrangement and multiplexed sensing is necessary as used in a conventional NAND DRAM. We propose a novel PF-NAND cell which achieve the folded BL arrangement and non-multiplexed sensing. A new sense amplifier which is preferable for low voltage operated NAND DRAM is also developed. Furthermore, an SDRAM compatible interface is realized by introducing cache SRAM and wide-band I/O array architecture between the PF-NAND DRAM and cache SRAM.
Keywords :
DRAM chips; NAND circuits; VLSI; NAND DRAM cell; SDRAM compatible interface; cache SRAM architecture; dynamic RAM; folded bit line arrangement; low voltage operation; multi Gbit-scale DRAM; nonmultiplexed sensing; partially frozen NAND DRAM; sense amplifier; wideband I/O array architecture; Broadband amplifiers; Cache memory; Laboratories; Lithography; Random access memory; SDRAM; Tin; Ultra large scale integration; Voltage; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-4766-8
Type :
conf
DOI :
10.1109/VLSIC.1998.688014
Filename :
688014
Link To Document :
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