Title :
Modeling reversible self-discharge in series-connected Li-ion battery cells
Author :
Muenzel, Valentin ; Brazil, Marcus ; Mareels, Iven ; de Hoog, Julian ; Thomas, Doreen Anne
Author_Institution :
Electr. & Electron. Eng, Univ. of Melbourne, Melbourne, VIC, Australia
Abstract :
Large battery systems like those in plug-in hybrid or pure electric vehicles contain strings of series-connected cells. Cell voltage imbalances within strings decrease useful string capacity and increase cell ageing. Balancing systems are often employed to alleviate imbalances but optimal design and sizing requires prediction of expected imbalance. This paper presents a methodology for simulating voltage imbalances caused by temperature-dependent reversible self-discharge processes in cells. Simulation results for a three-cell string with a 4°C operating cell temperature difference over 30 days show a maximum cell voltage divergence of less than 1mV. The same simulation with a malfunction-typical operating temperature difference of 20°C leads to a maximum voltage divergence of over 5mV. The results and underlying methodology are of value for battery pack manufacturers and designers of balancing systems.
Keywords :
battery management systems; battery powered vehicles; hybrid electric vehicles; lithium; secondary cells; Li; battery pack manufacturers; cell ageing; cell voltage imbalances; large battery systems; malfunction-typical operating temperature; maximum cell voltage divergence; maximum voltage divergence; optimal design; plug-in hybrid electric vehicles; pure electric vehicles; reversible self-discharge; series-connected Li-ion battery cells; string capacity; temperature 4 degC; temperature-dependent reversible self-discharge processes; three-cell string; voltage imbalances; Batteries; Discharges (electric); Integrated circuit modeling; Mathematical model; Springs; Standards; System-on-chip; Balancing Systems; Battery Management System (BMS); Cell Imbalance; Lithium-ion (Li-ion) Battery; Self-Discharge;
Conference_Titel :
TENCON Spring Conference, 2013 IEEE
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4673-6347-1
DOI :
10.1109/TENCONSpring.2013.6584489