Title :
Workload-Cognizant Impact Analysis and its Applications in Error Detection and Tolerance in Modern Microprocessors
Author_Institution :
Yale Univ., New Haven, CT, USA
Abstract :
This paper discusses the relative importance of errors in a modern microprocessor based on the impact that they incur on the execution of typical workload. These information can prove immensely useful in allocating resources to enhance on-line testability and error resilience through concurrent error detection/correction methods. This paper also presents an extensive fault simulation infrastructure which is being developed around a superscalar, dynamically- scheduled, out-of-order, Alpha-like microprocessor, which supports execution of SPEC2000 integer benchmarks and enables the aforementioned correlation study.
Keywords :
error correction; error detection; fault tolerance; microprocessor chips; tolerance analysis; Alpha-like microprocessor; SPEC2000 integer benchmarks; error detection/correction methods; error resilience; fault simulation infrastructure; on-line testability; resource allocation; tolerance detection; workload-cognizant impact analysis; Application software; Circuit faults; Circuit testing; Computer science; Electronic equipment testing; Error correction; Fault tolerant systems; Microprocessors; System testing; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-0-7695-3839-6
DOI :
10.1109/DFT.2009.64