Title :
Using stochastic logic for efficient pattern recognition analysis
Author :
Rosselló, Jose L. ; Canals, Vincent ; De Paul, Ivan ; Segura, Jaume
Author_Institution :
Electron. Technol. Group, Balearic Islands Univ., Palma de Mallorca
Abstract :
We present a pattern recognition methodology based on stochastic logic. The technique implements a parallel comparison of input data from a set of sensors to various pre-stored categories. Smart pulse-based stochastic-logic blocks are constructed to provide an efficient architecture that is able to implement Bayesian techniques, thus providing a low-cost solution in terms of gate count and power dissipation. The proposed architecture is applied to a specific navigation problem demonstrating that the system provides an almost optimal solution.
Keywords :
Bayes methods; formal logic; pattern recognition; stochastic processes; Bayesian techniques; optimal solution; parallel comparison; pattern recognition; smart pulse-based stochastic-logic blocks; stochastic logic; Bayesian methods; Mobile robots; Neural networks; Pattern analysis; Pattern recognition; Power dissipation; Probabilistic logic; Remotely operated vehicles; Stochastic processes; Stochastic resonance;
Conference_Titel :
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-1820-6
Electronic_ISBN :
1098-7576
DOI :
10.1109/IJCNN.2008.4633929