Title :
A comparison of the 3D kinematic measurements obtained by single-plane 2D-3D image registration and RSA
Author :
Muhit, Abdullah A. ; Pickering, Mark R. ; Ward, Tom ; Scarvell, Jennie M. ; Smith, Paul N.
Author_Institution :
Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
3D computed tomography (CT) to single-plane 2D fluoroscopy registration is an emerging technology for many clinical applications such as kinematic analysis of human joints and image-guided surgery. However, previous registration approaches have suffered from the inaccuracy of determining precise motion parameters for out-of-plane movements. In this paper we compare kinematic measurements obtained by a new 2D-3D registration algorithm with measurements provided by the gold standard Roentgen Stereo Analysis (RSA). In particular, we are interested in the out-of-plane translation and rotations which are difficult to measure precisely using a single plane approach. Our experimental results show that the standard deviation of the error for out-of-plane translation is 0.42 mm which compares favourably to RSA. It is also evident that our approach produces very similar flexion/extension, abduction/adduction and external knee rotation angles when compared to RSA.
Keywords :
biomedical measurement; computerised tomography; diagnostic radiography; image registration; medical image processing; stereo image processing; 2D fluoroscopy; 3D computed tomography; 3D kinematic measurements; CT; RSA; Roentgen Stereo Analysis; human joints; image-guided surgery; single-plane 2D-3D image registration; Bones; Computed tomography; Joints; Kinematics; Knee; Three dimensional displays; X-ray imaging; Algorithms; Fluoroscopy; Humans; Image Processing, Computer-Assisted; Imaging, Three-Dimensional; Radiographic Image Interpretation, Computer-Assisted; Tomography, X-Ray Computed;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5628083