Can Functional Test Achieve Low-cost Full Coverage of NoC Faults?

Abstract form only given. This talk focuses on the functional testing of the NoC infrastructure. Herein, we are seeking for the integration of the test of interconnects and routers, at the lowest possible cost. Therefore, a manufacturing test strategy is proposed, that considers more realistic, logic level fault models, and attempts to fully cover faults that affect both the router logic and the communication channel wires. A functional-based approach is preferred, to reduce NoC re-design costs and to provide at-speed testing. However, scan and BISTbased approaches may be required to enhance both fault coverage and test application time.