Title :
Current self-distribution effect in diode lasers and amplifiers
Author :
Eliseev, Petr G. ; Osinski, Marek
Author_Institution :
Center for High Technol. Mater., New Mexico Univ., Albuquerque, NM, USA
Abstract :
Summary form only given. In conclusion, we have proposed a simple criterion to estimate the influence of current crowding in laser diodes and amplifiers induced by a spatial distribution of stimulated recombination. The carrier distribution smoothening due to the current self distribution (CSD) occurs over large distances, in contrast to diffusion smoothening which is only effective at short distances (comparable to the carrier diffusion length)
Keywords :
carrier lifetime; laser theory; semiconductor lasers; stimulated emission; carrier diffusion length; carrier distribution smoothening; current crowding; current self distribution; current self-distribution effect; diffusion smoothening; diode lasers; large distances; laser amplifiers; laser diodes; short distances; spatial distribution; stimulated recombination; Charge carrier lifetime; Current density; Diode lasers; Electrons; Laser modes; Laser stability; Optical amplifiers; Optical sensors; Radiative recombination; Voltage;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2450-1
DOI :
10.1109/LEOS.1995.484820
