• DocumentCode
    2956633
  • Title

    A Fault Analysis and Classifier Framework for Reliability-Aware SRAM-Based FPGA Systems

  • Author

    Bolchini, Cristiana ; Castro, Fabrizio ; Miele, Antonio

  • Author_Institution
    Dip. Elettron. e Inf., Politec. di Milano, Milan, Italy
  • fYear
    2009
  • fDate
    7-9 Oct. 2009
  • Firstpage
    173
  • Lastpage
    181
  • Abstract
    This paper presents a new framework for the analysis of SRAM-based FPGA systems with respect to their dependability properties against single, multiple and cumulative upsets errors. The aim is to offer an environment for performing fault classification and error propagation analyses for designed featuring fault detection or tolerance techniques against soft errors, where the focus is not only the overall achieved fault coverage, but an understanding of the fault/error relation inside the internal elements of the system. We propose a fault analyzer/classifier laying on top of a classical fault injection engine, used to monitor the evolution of the system after a fault as occurred, with respect to the applied reliability-oriented design technique. The paper introduces the framework and reports some experimental results of its application to a case study, to highlight the benefits of the proposed solution.
  • Keywords
    SRAM chips; fault simulation; field programmable gate arrays; logic design; FPGA; SRAM; classifier framework; error propagation; fault analysis; fault classification; field programmable gate arrays; soft errors; static RAM; tolerance techniques; Engines; Error analysis; Fault detection; Fault tolerant systems; Field programmable gate arrays; Monitoring; Paper technology; Performance analysis; Statistical analysis; Very large scale integration; FPGA; Fault Analysis; Fault Injection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-3839-6
  • Type

    conf

  • DOI
    10.1109/DFT.2009.10
  • Filename
    5372258