Title :
Testing fault-tolerant systems using a unified error model
Author :
Tyrrell, Am ; Bass, JM
Author_Institution :
Dept. of Electron., York Univ., UK
Abstract :
This paper presents a method of designing test data based around a unified error model. The model allows error `surfaces´ to be defined for a given application, and used to define a test region(s) that give a measure of test coverage. The paper applies the model to an illustrative example to show how it might be used in an autopilot model
Keywords :
aircraft control; computer testing; errors; fault tolerant computing; autopilot model; fault-tolerant systems testing; surfaces; test coverage; test data design; test regions; unified error model; Circuit faults; Computer crashes; Data engineering; Electronic equipment testing; Error correction; Fault tolerance; Fault tolerant systems; Hardware; Integrated circuit modeling; System testing;
Conference_Titel :
EUROMICRO 97. 'New Frontiers of Information Technology'. Short Contributions., Proceedings of the 23rd Euromicro Conference
Conference_Location :
Budapest
Print_ISBN :
0-8186-8215-9
DOI :
10.1109/EMSCNT.1997.658455
