Title :
Coded DNA Self-Assembly for Error Detection/Location
Author :
Arani, Zahra Mashreghian ; Hashempour, Masoud ; Lombardi, Fabrizio
Author_Institution :
Dept. of ECE, Northeastern Univ., Boston, MA, USA
Abstract :
This paper proposes a novel framework in which DNA self-assembly can be analyzed for error detection/ location. The proposed framework relies on coding and mapping functions that allow to establish the presence of erroneous bonded tiles based on the pattern to be assembled (as defined by the tile set) and its current aggregate. As a widely used pattern and instantiation of this process, the Sierpinski Triangle self-assembly is analyzed in detail.
Keywords :
DNA; error detection codes; nanofabrication; self-assembly; Sierpinski triangle self-assembly; coded DNA self-assembly; error detection; error location; error resilience; mapping functions; Aggregates; Assembly; Bonding; DNA; Error analysis; Error correction; Fault detection; Manufacturing; Self-assembly; Tiles; Coding; Error Detection; Error Resilience; Nano Manufacturing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-0-7695-3839-6
DOI :
10.1109/DFT.2009.13
