• DocumentCode
    2956823
  • Title

    High performance VLSI for space and commercial applications

  • Author

    Maki, Gary K. ; Shaw, Harry C. ; Chen, Kristen Q.

  • Author_Institution
    New Mexico Univ., Albuquerque, NM, USA
  • fYear
    1996
  • fDate
    21-24 Oct 1996
  • Firstpage
    325
  • Lastpage
    328
  • Abstract
    High performance VLSI is a key electronic technology required to advance science and commercial space missions. This paper illustrates several such NASA applications which require special purpose VLSI. In addition to being able to solve unique scientific problems, specialized VLSI can provide breakthrough technology for new commercial products. For example, the basic technology used to solve a key problem for the Hubble Space Telescope is now used in modern disc drives and digital cable television set top boxes. Spaceflight qualified, application specific VLSI integrated circuits simplify the task of incorporating commercial technology into space hardware. NASA maintains a substantial effort to characterize the hardness of commercial IC processes and parts for total ionizing dose (TID), single event upset (SEU) and single event latchup (SEL). NASA uses this information as a key element in partitioning circuits. By combining this information with a mission´s orbital dynamics, duration and criticality, NASA is utilizing more commercial IC products without increase in mission risk
  • Keywords
    CMOS integrated circuits; VLSI; application specific integrated circuits; radiation hardening (electronics); IC hardness; NASA; SEL; SEU; application specific VLSI circuits; circuit partitioning; commercial applications; high performance VLSI; single event latchup; single event upset; space applications; total ionizing dose; Application specific integrated circuits; Cable TV; Drives; Integrated circuit technology; NASA; Single event upset; Space missions; Space technology; Telescopes; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 1996., 2nd International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    7-5439-0940-5
  • Type

    conf

  • DOI
    10.1109/ICASIC.1996.562819
  • Filename
    562819