Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems

Author

Starr, George J. ; Qin, Jie ; Dutton, Bradley F. ; Stroud, Charles E. ; Dai, F. Foster ; Nelson, Victor P.

Author_Institution

Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA

fYear

2009

fDate

7-9 Oct. 2009

Firstpage

11

Lastpage

19

Abstract

This paper presents a software based approach for automatic generation of digital circuitry for synthesis and incorporation in a mixed-signal circuit or system to provide built-in self-test (BIST) and measurement of the analog circuitry. The measurements supported by the BIST circuitry include frequency response (both gain and phase), linearity and noise figure. The measurements provide analog functional testing as well as the basis for on-chip compensation to improve yield during manufacturing and performance during system operation.

Keywords

analogue integrated circuits; built-in self test; frequency response; mixed analogue-digital integrated circuits; analog circuitry; analog functional testing; automated generation; built-in self-test; digital circuitry; frequency response; linearity; measurement circuitry; mixed-signal circuits; mixed-signal systems; noise figure; on-chip compensation; software-based approach; system operation; Built-in self-test; Circuit synthesis; Circuits and systems; Embedded software; Frequency measurement; Frequency response; Gain measurement; Noise measurement; Phase measurement; Software measurement; ADC; Auburn University; BIST; C; C++; DAC; DUT; Graduate; LUT; Mixed signal; NCO; ORA; TPG; analog; automation; cos; cosine; gain; linearity; phase; program generation; research; sin; wave; wave generator;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on

Conference_Location

Chicago, IL

ISSN

1550-5774

Print_ISBN

978-0-7695-3839-6

Type

conf

DOI

10.1109/DFT.2009.43

Filename

5372279