Title :
Fusion of biometric systems using one-class classification
Author :
Bergamini, Cheila ; Oliveira, Luiz S. ; Koerich, Alessandro L. ; Sabourin, Robert
Author_Institution :
Pontifical Catholic Univ. of Parana, Curitiba
Abstract :
One of the main requirements of biometric systems is the ability of producing very low false acceptation rate, which very often can be achieved only by combining different biometric traits. The literature has shown that the pattern classification approach usually surpasses the classifier combination approach for this task. In this work we take into account the pattern classification approach, but considering the one-class classification approach. We show that one-class classification could be considered as an alternative for biometric fusion specially when the data is highly unbalanced or data from a single class is available. The results for one-class classification reported in this paper compares to the standard two-class SVM and surpasses all the conventional classifier combination rules tested.
Keywords :
biometrics (access control); pattern classification; security of data; biometric fusion; false acceptation rate; one-class classification; pattern classification; two-class SVM; Application software; Authentication; Biometrics; Costs; Information resources; NIST; Pattern classification; Support vector machine classification; Support vector machines; System testing; One-class classification; multimodal biometric systems;
Conference_Titel :
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-1820-6
Electronic_ISBN :
1098-7576
DOI :
10.1109/IJCNN.2008.4633967