DocumentCode
2957129
Title
Applications of on-chip samplers for test and measurement of integrated circuits
Author
Ron Ho ; Amrutur, B. ; Ken Mai ; Wilburn, B. ; Mori, T. ; Horowitz, M.
Author_Institution
Stanford Univ., CA, USA
fYear
1998
fDate
11-13 June 1998
Firstpage
138
Lastpage
139
Abstract
Displaying the real-time behavior of critical signals on VLSI chips is difficult and can require expensive test equipment. We present a simple sampling technique to display the analog waveforms of high bandwidth on-chip signals on a laboratory oscilloscope. It is based on the subsampling of periodic signals. This circuit was used to verify the operation of a recent low-power SRAM design.
Keywords
VLSI; integrated circuit measurement; integrated circuit testing; signal sampling; IC measurement; IC testing; VLSI chips; analog waveforms; critical signals; high bandwidth on-chip signals; low-power SRAM design; on-chip samplers; periodic signals; real-time behavior; sampling technique; Bandwidth; Circuits; Displays; Laboratories; Oscilloscopes; Sampling methods; Semiconductor device measurement; Test equipment; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on
Conference_Location
Honolulu, HI, USA
Print_ISBN
0-7803-4766-8
Type
conf
DOI
10.1109/VLSIC.1998.688033
Filename
688033
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