Title :
An ultrafast photoconductive sampling gate integrated with a JFET amplifier
Author :
Hwang, Jiunn-Ren ; Cheng, Heng-Ju ; Whitaker, John F. ; Rudd, J.V.
Author_Institution :
Ultrafast Sci. Center, Michigan Univ., Ann Arbor, MI, USA
Abstract :
Ultrafast photoconductive (PC) sampling techniques have been used in the measurement of electrical waveforms with picosecond resolution and high sensitivity. In this work, an integrated JFET source follower/amplifier, with its high input impedance and low input capacitance (3 pF), has been found to sense absolute signal voltages noninvasively, with as much as 150 times larger output signal levels than those of unamplified PC gates
Keywords :
capacitance; field effect integrated circuits; high-speed optical techniques; integrated circuit testing; integrated optoelectronics; photoconducting devices; 3 pF; JFET amplifier integration; absolute signal voltages; electrical waveform measurement; high input impedance; high sensitivity; integrated JFET source follower/amplifier; integrated optoelectronics; low input capacitance; output signal levels; picosecond resolution; ultrafast photoconductive sampling gate; unamplified PC gates; Capacitance; Electric variables measurement; Electrical resistance measurement; Laser excitation; Photoconductivity; Power lasers; Sampling methods; Spatial resolution; Switches; Voltage;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2450-1
DOI :
10.1109/LEOS.1995.484894
