• DocumentCode
    295731
  • Title

    Picosecond lifetime and high resistivity in As or Ga implanted GaAs: an alternative material for fast optoelectronic applications

  • Author

    Tan, H.H. ; Jagadish, C. ; Kaminska, M. ; Jasinski, J. ; Krotkus, A. ; Marcinkevicius, S.

  • Author_Institution
    Dept. of Electron. Mater. Eng., Australian Nat. Univ., Canberra, ACT, Australia
  • Volume
    1
  • fYear
    1995
  • fDate
    30-31 Oct 1995
  • Firstpage
    345
  • Abstract
    In this work, we report an alternative method of obtaining highly non-stoichiometric GaAs layers by implanting semi-insulating GaAs with high doses of As or Ga ions. The implanted samples were then annealed in the temperature range of 300-800°C. At the temperatures of 500-600°C, properties similar to that of low temperature LT-GaAs can be achieved. Beside providing an alternative material comparable to LT-GaAs, ion-implantation has advantages over epitaxial technique in terms of device fabrication. Ion implantation allows precise control over the incorporation of implanted ions on selected areas of the wafer. Furthermore, ion implantation provides a simple and cost effective way of device fabrication as it is compatible to the current planar fabrication technology
  • Keywords
    annealing; arsenic; carrier lifetime; electrical conductivity; gallium; gallium arsenide; high-speed optical techniques; integrated optoelectronics; ion implantation; optical fabrication; 300 to 800 C; 500 to 600 C; As implanted GaAs; Ga implanted GaAs; GaAs; GaAs:Ga,As; alternative material; annealed; device fabrication; epitaxial technique; high doses; high resistivity; highly non-stoichiometric GaAs layers; ion-implantation; picosecond lifetime; planar fabrication technology; semi-insulating GaAs; temperature range; Annealing; Capacitive sensors; Charge carrier lifetime; Conductivity; Fabrication; Gallium arsenide; Ion implantation; Photoconducting materials; Physics; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2450-1
  • Type

    conf

  • DOI
    10.1109/LEOS.1995.484900
  • Filename
    484900