• DocumentCode
    2957349
  • Title

    Direct extraction of SPICE Gummel-Poon parameters for high frequency modeling

  • Author

    Breti, J.W. ; Kendall, J.D. ; Nathawad, L.

  • Author_Institution
    Gennum Corp., Burlington, Ont., Canada
  • fYear
    1998
  • fDate
    23-26 Mar 1998
  • Firstpage
    83
  • Lastpage
    88
  • Abstract
    A method to directly extract the DC and AC SPICE Gummel-Poon parameters without optimization is presented. The DC extraction uses linear or explicit extraction equations. The AC extraction involves obtaining the SPICE AC equivalent circuit from measured S-parameter data, and then extracting the SPICE parameters from the bias dependence of the AC equivalent circuit elements. By comparing measured and simulated S-parameters, it is verified that the resulting parameter set provides accurate modeling across frequency and bias, making accurate circuit simulation and statistical studies possible
  • Keywords
    S-parameters; SPICE; bipolar integrated circuits; bipolar transistors; circuit analysis computing; equivalent circuits; integrated circuit modelling; integrated circuit testing; microwave integrated circuits; statistical analysis; AC SPICE Gummel-Poon parameters; AC equivalent circuit element bias dependence; AC extraction; DC SPICE Gummel-Poon parameters; DC extraction; S-parameter data; SPICE AC equivalent circuit; SPICE Gummel-Poon parameters; SPICE parameters; bipolar transistor models; circuit simulation; direct SPICE Gummel-Poon parameter extraction; explicit extraction equations; high frequency modeling; linear extraction equations; measured S-parameters; modeling; parameter set; simulated S-parameters; statistical analysis; Capacitance; Data mining; Electrical resistance measurement; Equations; Equivalent circuits; Frequency measurement; Kirk field collapse effect; SPICE; Scattering parameters; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on
  • Conference_Location
    Kanazawa
  • Print_ISBN
    0-7803-4348-4
  • Type

    conf

  • DOI
    10.1109/ICMTS.1998.688047
  • Filename
    688047