Title :
About the existing discrepancy in the determinations of the Avogadro constant
Author :
Martin, J. ; Bettin, H. ; Kuetgens, U. ; Schiel, D. ; Stumpel, J. ; Becker, P.
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
The values for the Avogadro constant, derived from the atomic and molar volume of silicon at several metrological institutes, show significant differences. To illuminate this discrepancy, comparison measurements of density, lattice parameters and positron annihilation were performed. The existing differences cannot be explained by the residual point defect contents but probably by small voids in the lattice.
Keywords :
constants; density measurement; lattice constants; measurement uncertainty; positron annihilation; silicon; voids (solid); Avogadro constant; Si; atomic volume of silicon; average interatomic distance; comparison measurements; density; lattice parameters; molar volume of silicon; positron annihilation; silicon lattice spacing; small voids; Atomic measurements; Crystals; Density measurement; Impurities; Lattices; Performance evaluation; Positrons; Prototypes; Silicon; Temperature measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699964
