• DocumentCode
    2957607
  • Title

    Thermomechanical fatigue of solder joints: a new comprehensive test method

  • Author

    Frear, D.R.

  • Author_Institution
    Sandia Nat. Lab., Albuquerque, NM, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    293
  • Lastpage
    300
  • Abstract
    A test method involving simultaneous imposition of temperature cycles and strain on discrete solder joints in a shear orientation is presented. The stress, microstructure, and number of cycles to failure were monitored. Cycles to failure were determined by a continuous electrical detection method. Solder joints with composition 60Sn-40Pb and 40Sn-40In-20Pb were tested using the method at 20% shear strain. The 60Sn-40Pb alloy had a shorter fatigue lifetime than did 40Sn-40In-20Pb. This is attributed to heterogeneous coarsening that concentrates strain in a small area of the 60Sn-40Pb microstructure. In contrast the 40Sn-40In-20Pb microstructure becomes refined. The heterogeneous coarsening also results in cyclic softening in 60Sn-40Pb, which was not observed in 4Sn-40In-20Pb. Failures initiated within the coarsened band in 60Sn-40Pb at Sn-Sn grain boundaries or phase boundaries. In contrast, failures initiated at the surface of 40Sn-40In-20Pb joints and propagated through both phases of the microstructure
  • Keywords
    alloys; failure analysis; fatigue testing; life testing; soldering; thermal stress cracking; SnInPb alloy solder joints; SnPd alloy solder joints; comprehensive test method; continuous electrical detection method; cracking; cyclic softening; discrete solder joints; fatigue lifetime; heterogeneous coarsening; joint surface failures; microstructure; microstructure phases; number of cycles to failure; phase boundaries; refined microstructure; shear orientation; shear strain; simultaneous imposition; strain; stress; temperature cycles; thermomechanical fatigue; Capacitive sensors; Condition monitoring; Fatigue; Microstructure; Softening; Soldering; Temperature; Testing; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77763
  • Filename
    77763