Title :
Noise Modeling For Charge Amplification and Sampling
Author :
Pittet, Patrick ; Lu, Guo-Neng ; Quiquerez, Laurent
Author_Institution :
Univ. Claude Bernard Lyon 1, Villeurbanne
Abstract :
A new cyclostationarity-based analytical model for noise analysis of a charge amplifier followed by a correlated double sampling (CDS) circuit is proposed. It determines output noise (power spectral density and squared voltage) resulting from input noise voltages and currents. Model validation is performed by comparing the obtained results with those of temporal noise simulations. This model allows analysis of consequences of CDS and integration duration on noise contributions. It predicts that CDS does not suppress or attenuate effect of input current sources. In the case of 1/f input noise current, the SNR can not be improved by increasing the integration duration.
Keywords :
amplifiers; circuit noise; charge amplification; charge amplifier; charge sampling; correlated double sampling circuit; cyclostationarity-based analytical model; model validation; noise modeling; power spectral density; squared voltage; temporal noise simulations; Analytical models; Capacitive sensors; Circuit noise; Circuit simulation; Frequency domain analysis; Instruments; Photodetectors; Sampling methods; Signal to noise ratio; Voltage;
Conference_Titel :
Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
Conference_Location :
Nice
Print_ISBN :
1-4244-0395-2
Electronic_ISBN :
1-4244-0395-2
DOI :
10.1109/ICECS.2006.379668