• DocumentCode
    2957768
  • Title

    Volatile species from conductive die attach adhesives

  • Author

    Benson, R.C. ; Phillips, T.E. ; deHaas, N.

  • Author_Institution
    Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    301
  • Lastpage
    308
  • Abstract
    An investigation of microelectronic conductive die attach adhesives to determine the volatile species that evolve during cure and after postcure processing, such as preseal bakeout and burn-in, is described, and the results are presented and discussed. Gas chromatography/mass spectrometry was used to measure the volatile species, and complementary thermal analysis measurements were also obtained. The adhesives investigated were Adlebond 84-1LMINB1, Emerson and Cuming C-868-1, and Epo-tek H35-175MP, all silver-loaded epoxies used for electrically conductive component attachment. A comparison with previous mass spectrometry results shows that the sensitivity of the combined method is much higher, especially for higher molecular weight molecules, and that the identification of the outgassing species is simplified
  • Keywords
    adhesion; chromatography; conducting polymers; filled polymers; integrated circuit testing; mass spectroscopic chemical analysis; microassembling; thermal analysis; Adlebond 84-1LMINB1; Emerson and Cuming C-868-1; Epo-tek H35-175MP; burn-in; combined method sensitivity; complementary thermal analysis measurements; cure processing; electrically conductive component attachment; gas chromatography/mass spectrometry; higher molecular weight molecules; microelectronic conductive die attach adhesives; outgassing species; postcure processing; preseal bakeout; silver-loaded epoxies; volatile species; Bonding; Electronic packaging thermal management; Impurities; Inorganic materials; Mass spectroscopy; Microassembly; Microelectronics; Moisture; Pollution measurement; Surface contamination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77764
  • Filename
    77764