DocumentCode :
2957768
Title :
Volatile species from conductive die attach adhesives
Author :
Benson, R.C. ; Phillips, T.E. ; deHaas, N.
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
fYear :
1989
fDate :
22-24 May 1989
Firstpage :
301
Lastpage :
308
Abstract :
An investigation of microelectronic conductive die attach adhesives to determine the volatile species that evolve during cure and after postcure processing, such as preseal bakeout and burn-in, is described, and the results are presented and discussed. Gas chromatography/mass spectrometry was used to measure the volatile species, and complementary thermal analysis measurements were also obtained. The adhesives investigated were Adlebond 84-1LMINB1, Emerson and Cuming C-868-1, and Epo-tek H35-175MP, all silver-loaded epoxies used for electrically conductive component attachment. A comparison with previous mass spectrometry results shows that the sensitivity of the combined method is much higher, especially for higher molecular weight molecules, and that the identification of the outgassing species is simplified
Keywords :
adhesion; chromatography; conducting polymers; filled polymers; integrated circuit testing; mass spectroscopic chemical analysis; microassembling; thermal analysis; Adlebond 84-1LMINB1; Emerson and Cuming C-868-1; Epo-tek H35-175MP; burn-in; combined method sensitivity; complementary thermal analysis measurements; cure processing; electrically conductive component attachment; gas chromatography/mass spectrometry; higher molecular weight molecules; microelectronic conductive die attach adhesives; outgassing species; postcure processing; preseal bakeout; silver-loaded epoxies; volatile species; Bonding; Electronic packaging thermal management; Impurities; Inorganic materials; Mass spectroscopy; Microassembly; Microelectronics; Moisture; Pollution measurement; Surface contamination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location :
Houston, TX
Type :
conf
DOI :
10.1109/ECC.1989.77764
Filename :
77764
Link To Document :
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