• DocumentCode
    2957907
  • Title

    LS-SVM for bad debt risk assessment in enterprises

  • Author

    Hu, Yunlong ; Li, Yongchen

  • Author_Institution
    Sch. of Bus. Adm., North China Electr. Power Univ., Baoding
  • fYear
    2008
  • fDate
    1-8 June 2008
  • Firstpage
    1665
  • Lastpage
    1669
  • Abstract
    With the development of market economy in China, the problem of bad debt becomes increasingly serious in enterprises. In this paper, a bad-debt-risk evaluation model is established based on LS-SVM classifier, using a new set of index system which combines financial factors with non-financial factors on the basis of the 5C system evaluation method. The bad debt rating is separated into four classes- normality, attention, doubt and loss through analyzing accounts payable. Then the LS-SVM classifier is trained with 220 samples which are stochastically extracted from listed companies of China in industry, and the four classes are identified by the trained classifier using 80 samples. Then, BP neural network is also used to assess the same data. The experiment results show that LS-SVM has an excellent performance on training accuracy and reliability in credit risk assessment and achieves better performance than BP neural network.
  • Keywords
    backpropagation; financial data processing; least squares approximations; neural nets; risk management; stochastic processes; support vector machines; 5C system evaluation method; BP neural network; China market economy; LS-SVM; bad debt risk assessment; credit risk assessment; index system; stochastic extraction; Aging; Bayesian methods; Companies; Data mining; Industrial training; Kernel; Neural networks; Risk analysis; Risk management; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1098-7576
  • Print_ISBN
    978-1-4244-1820-6
  • Electronic_ISBN
    1098-7576
  • Type

    conf

  • DOI
    10.1109/IJCNN.2008.4634021
  • Filename
    4634021