Title :
Reliable and low cost wafer level packaging. Process description and qualification testing results for wide area vertical expansion (WAVE TM) package technology
Author :
Solberg, Vern ; Light, David ; Fjelstad, Joseph
Author_Institution :
Tessera Inc., San Jose, CA, USA
Abstract :
A number of companies around the world are developing or have begun offering devices processed and packaged in the wafer format. Most of these competing concepts involve the creation of a redistribution layer over the face of the chip, a method long employed by IBM in the development of its well known flip-chip C4 processes. Wafer level packaging has the potential for transforming IC packaging from a labor intensive process of making wire bonds one-at-a-time on individual die, to a batch process, much like wafer fabrication. Tessera has developed a unique approach to wafer level packaging that provides a physically robust, compliant structure while offering significant cost reduction through a unique method of mass termination and encapsulation. In this paper, the authors describe the materials and process developed for utilization of “wide area vertical expansion” (WAVETM ), producing what may prove to be the most reliable chip-size package available. To back up this rather bold statement, the environmental test program description is outlined and test data is offered for review
Keywords :
chip scale packaging; encapsulation; environmental testing; integrated circuit bonding; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; IC packaging; WAVE package technology; batch process; compliant structure; cost reduction; encapsulation; environmental test program description; flip-chip C4 processes; labor intensive process; mass termination; process description; process development; redistribution layer; reliable chip-size package; reliable wafer level packaging; test data; wafer fabrication; wafer format packaging; wafer level packaging; wafer level packaging cost; wide area vertical expansion; wide area vertical expansion package technology; wire bonds; Chip scale packaging; Costs; Design engineering; Electronics packaging; Integrated circuit packaging; Manufacturing; Qualifications; Testing; Wafer scale integration; Wire;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2000. Twenty-Sixth IEEE/CPMT International
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-6482-1
DOI :
10.1109/IEMT.2000.910715