• DocumentCode
    2959296
  • Title

    Array sockets and connectors using MicroSpringTM technology

  • Author

    Tracy, Nathan L. ; Rothenberger, Richard ; Copper, Charles ; Corman, N. ; Biddle, Gary ; Matthews, Alexandra ; McCarthy, Sean

  • Author_Institution
    Tyco Electron. Corp., Harrisburg, PA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    129
  • Lastpage
    140
  • Abstract
    In the electronics industry, there are a number of market factors driving the development of separable high density array connections for socketing components and interconnecting printed circuit boards. Many of the existing socket and connector technologies do not ideally address these needs. Finer pitch, lower height, improved electrical performance, lower mating force, higher durability, and industry standard manufacturing processes are required, to name a few. In addition, quick to market, economical prototyping and competitive production costs are necessary. To meet this diverse set of requirements, a revolutionary, bondwire scale contact technology has been developed and applied to several types of interconnection products. This technology, as well as its associated fabrication process is easily customized for each application and is capable of contact pitches down to 0.5 mm (0.019 in) at 10 to 15 g of normal (mating) force. This paper describes the process used to create reliable contact structures, including examples of process variables that can be altered to meet application specific mechanical and electrical performance requirements. The results of electrical and mechanical modeling of several contact geometries are presented and discussed, as well as reliability test results and contact interface mechanics analysis. A concluding section is devoted to a discussion of the practical application of this technology to interconnection products with examples of current applications and products in development
  • Keywords
    circuit reliability; electric connectors; electrical contacts; fine-pitch technology; integrated circuit interconnections; integrated circuit packaging; lead bonding; printed circuit accessories; printed circuit testing; rapid prototyping (industrial); MicroSpring technology; PCB interconnection; application specific electrical performance; application specific mechanical performance; array connectors; array sockets; bondwire scale contact technology; competitive production costs; component socketing; connector technologies; contact geometries; contact interface mechanics analysis; contact pitch; durability; economical prototyping; electrical modeling; electrical performance; electronics industry; fabrication process; industry standard manufacturing processes; interconnection products; market factors; mating force; mechanical modeling; package height; package pitch; printed circuit boards; process variables; reliability test; reliable contact structures; separable high density array connections; socket technologies; time to market; Connectors; Contacts; Electrical products industry; Electronics industry; Integrated circuit interconnections; Manufacturing industries; Manufacturing processes; Printed circuits; Prototypes; Sockets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 2000. Twenty-Sixth IEEE/CPMT International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-6482-1
  • Type

    conf

  • DOI
    10.1109/IEMT.2000.910721
  • Filename
    910721