Title :
Performance of Si-Integrated Wide-Band Single-Ended Switched Capacitor Arrays
Author :
Mendes, Luís ; Vaz, João Caldinhas ; Rosário, Maria João
Author_Institution :
Inst. Politecnico de Leiria, Leiria
Abstract :
A closed-form equation for the quality factor of CMOS or BiCMOS single-ended switched capacitor arrays (SSCAs), intended for radio-frequency (RF) and microwave switched tuning resonators, is presented and analyzed. This expression predicts accurately the SSCA quality factor (Qssca) with respect to the operation frequency and tuning control input. Important results arise from this equation, viz., Qssca shows a strong dependence on the reference cell electric parameters, presents a monotonically behavior with the tuning control input, is independent of the SSCA size (number of cells) and increases as the technology scales down. Besides that, new concepts are also introduced, namely, basic switch, reference switch, reference capacitor and reference cell. A 0.1 to 6 GHz SSCA, designed with standard 0.35 mum 2-poly 4-metal mixed-signal CMOS technology, is also described. The SSCA has a capacitive tuning range from 210 to 385 fF with a resolution capacitance of 25 fF. The theoretical results, obtained with the SSCA model, match the SSCA layout Spectrereg RF simulation.
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; MMIC; Q-factor; UHF integrated circuits; VHF circuits; switched capacitor networks; BiCMOS; capacitance 210 fF to 385 fF; capacitance 25 fF; closed-form equation; complementary metal-oxide-semiconductor; frequency 0.1 GHz to 6 GHz; microwave switched tuning resonator; mixed-signal CMOS technology; quality factor; radiofrequency; reference capacitor; reference cell electric parameter; reference switch; tuning control; wide-band single-ended switched capacitor array; BiCMOS integrated circuits; CMOS technology; Capacitors; Equations; Microwave antenna arrays; Q factor; Radio frequency; Switches; Tuning; Wideband;
Conference_Titel :
Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
Conference_Location :
Nice
Print_ISBN :
1-4244-0395-2
Electronic_ISBN :
1-4244-0395-2
DOI :
10.1109/ICECS.2006.379830