DocumentCode :
2959648
Title :
A study on the reliability of stencil printed solder bumps
Author :
Jang, Ho-Cheol ; Jee, Chul-Won ; Kim, Young-Ho ; Park, In-Bae ; Seo, Sung-Min ; Byung-Yul Min
Author_Institution :
Dept. of Mater. Eng., Hanyang Univ., Seoul, South Korea
fYear :
2000
fDate :
2000
Firstpage :
288
Lastpage :
293
Abstract :
The reliability of solder bumps formed using stencil printing and reflow was investigated for flip chip applications. Eutectic solder paste was printed through a metal mask and then reflowed repeatedly. The shear strength of the solder bumps and the process capability Cp were measured as a function of the number of solder reflows. Cu 6Sn5 was the only intermetallic compound observed in the interface after reflow. The thickness of the intermetallic compound rapidly increased with the number of reflow cycles, saturating after the third reflow. The intermetallic compound became scallop shaped after the third reflow, changing to a spheroid shape after the fifth reflow and was separated from the interface. The Cu was completely consumed by Cu-Sn reaction after the fifth reflow. The shear strength of the solder bumps increased with the number of reflow cycles until the fifth reflow, after which it decreased. The initial increase in shear strength is attributed to the reduction of pores in the solder bumps. The decrease of shear strength after 5 cycles of reflow is attributed to the direct contact between the solder and nonwettable metal
Keywords :
eutectic alloys; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; interface structure; lead alloys; microassembling; porosity; reflow soldering; shear strength; tin alloys; wetting; Cu; Cu consumption; Cu-Sn reaction; Cu6Sn5; Cu6Sn5 intermetallic compound; SnPb; direct solder/nonwettable metal contact; eutectic solder paste; flip chip applications; interface intermetallic separation; intermetallic compound thickness; metal mask; process capability; reflow; reflow cycles; reliability; scallop shaped intermetallic; shear strength; solder bump pore reduction; solder bumps; solder paste printing; solder reflow; spheroid shaped intermetallic; stencil printed solder bumps; stencil printing; Costs; Flip chip; Intermetallic; Lead; Materials science and technology; Printing; Reliability engineering; Semiconductor device measurement; Testing; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2000. Twenty-Sixth IEEE/CPMT International
Conference_Location :
Santa Clara, CA
ISSN :
1089-8190
Print_ISBN :
0-7803-6482-1
Type :
conf
DOI :
10.1109/IEMT.2000.910740
Filename :
910740
Link To Document :
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