DocumentCode
2959696
Title
High reliability LTCC BGA for telecom applications
Author
Prabhu, A. ; Schaefer, WJ ; Patil, S.
Author_Institution
Package Technol. Group, Nat. Semicond. Corp., Santa Clara, CA, USA
fYear
2000
fDate
2000
Firstpage
311
Lastpage
323
Abstract
The trend in the telecommunications industry is towards the usage of smaller packaging options while improving electrical and reliability performance. National Semiconductor, a producer of low temperature cofired ceramics (LTCC) and wireless components, strives to integrate these products into small, high performance modules. In particular, the module under development requires an LTCC substrate with ball grid array (BGA) ball attachment technique. This paper describes a series of experiments focused on materials selection required to produce high performance solder joints. Further evaluations were also performed to determine the printed circuit board (PCB) level reliability during thermal cycle life evaluation. This study evaluated commercially available LTCC pad metallizations and solder alloys, while also comparing several pad construction methods as a function of thermal cycle life. The results identify the key factors for material selection, which produced the maximum thermal cycle life for the LTCC BGA module
Keywords
assembling; ball grid arrays; ceramic packaging; circuit reliability; integrated circuit interconnections; integrated circuit packaging; life testing; modules; printed circuit testing; soldering; telecommunication equipment testing; thermal stresses; BGA ball attachment technique; LTCC; LTCC BGA; LTCC BGA module; LTCC pad metallization; LTCC substrate; PCB level reliability; ball grid array; electrical performance; high performance modules; low temperature cofired ceramics; material selection; materials selection; maximum thermal cycle life; packaging size; pad construction methods; printed circuit board; reliability; reliability performance; solder alloys; solder joints; telecom applications; telecommunications industry; thermal cycle life; thermal cycle life evaluation; wireless components; Ceramics; Communication industry; Electrical products industry; Electronics packaging; Joining materials; Semiconductor device packaging; Semiconductor materials; Substrates; Telecommunications; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 2000. Twenty-Sixth IEEE/CPMT International
Conference_Location
Santa Clara, CA
ISSN
1089-8190
Print_ISBN
0-7803-6482-1
Type
conf
DOI
10.1109/IEMT.2000.910743
Filename
910743
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