DocumentCode
2959728
Title
Line scratches detection and restoration via light diffraction
Author
Bruni, V. ; Vitulano, D. ; Kokaram, A.
Author_Institution
Inst. per le Applicazioni del Calcolo, CNR, Rome, Italy
Volume
1
fYear
2003
fDate
18-20 Sept. 2003
Firstpage
5
Abstract
This paper presents a unified model for the detection and removal of line scratches. It is based on modelling the scratch effect by allowing for the diffraction of light. The paper gives some evidence as to why light diffraction can give rise to scratches. The physical modelling of the defect along with its classification as region of partially missing data allows very good results both in detection and in restoration.
Keywords
image restoration; light diffraction; optical images; digital film sequences; light diffraction; line scratches detection; line scratches restoration; Brightness; Charge coupled devices; Degradation; Diffraction; Digital images; Educational institutions; Image restoration; Optical arrays; Parameter estimation; Proposals;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Signal Processing and Analysis, 2003. ISPA 2003. Proceedings of the 3rd International Symposium on
Print_ISBN
953-184-061-X
Type
conf
DOI
10.1109/ISPA.2003.1296858
Filename
1296858
Link To Document