Title :
A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters
Author :
Ingvarson, Fredrik ; Jeppson, Kjell O.
Author_Institution :
Dept. of Solid State Electron., Chalmers Univ. of Technol., Goteborg, Sweden
Abstract :
A new two-step direct extraction algorithm for the intrinsic Gummel-Poon BJT model parameters is presented. In contrast to existing methods, both original and SPICE Gummel-Poon Early effect parameters can be extracted in a coupled and consistent manner. The base current is not involved in the extraction of the Early effect; thus the influence of nonideal base current need not be considered. This ensures proper extraction of the Early voltages, which is a necessary precursor to accurate determination of the remaining parameters. All parameters are determined from linear systems of equations using traditional least square techniques. An analysis of the distribution and number of data points used in the extraction to minimize sensitivity to noise is also performed
Keywords :
SPICE; bipolar transistors; least squares approximations; semiconductor device models; Early effect; Early voltages; SPICE Gummel-Poon Early effect parameters; base current; direct extraction algorithm; intrinsic Gummel-Poon BJT model parameters; least square techniques; linear equation systems; noise sensitivity; nonideal base current effects; two-step direct extraction algorithm; Data mining; Equations; Integrated circuit synthesis; Least squares methods; Linear systems; Reactive power; SPICE; Solid modeling; Solid state circuits; Voltage;
Conference_Titel :
Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on
Conference_Location :
Kanazawa
Print_ISBN :
0-7803-4348-4
DOI :
10.1109/ICMTS.1998.688061
