Title :
A first attempt to realize (multiple-QHE devices)-series array resistance standards
Author :
Piquemal, F. ; Blanchet, J. ; Geneves, G. ; Andre, J.P.
Author_Institution :
BNM-LCIE, Fontenay-aux-Roses, France
Abstract :
This paper shows that the possibility exists to fabricate a single chip of 7.5/spl times/5.5 mm/sup 2/ composed of several QHE devices having the same density and mobility. Metrological characteristics of some samples with devices placed in series are described.
Keywords :
electric resistance measurement; measurement standards; quantum Hall effect; semiconductor superlattices; heterostructures; metrological characteristics; multiple-QHE devices; quantized resistances; resistance ratio bridge; series array resistance standards; single chip; Charge carrier density; Contact resistance; Electric resistance; Electrical resistance measurement; Gallium arsenide; Joining processes; Measurement standards; Metrology; Probes; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699977
