DocumentCode :
2960119
Title :
3-D reconstruction and measurement of microtubules from multiple angle-total internal reflection fluorescence microscopy
Author :
Qian Yang ; Karpikov, Alexander ; Toomre, D. ; Duncan, J.
Author_Institution :
Yale Univ., New Haven, CT, USA
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
172
Lastpage :
177
Abstract :
Total internal reflection fluorescence (TIRF) microscopy excites a thin evanescent field which theoretically decays exponentially. Each TIRF image is actually the projection of a 3-D volume and hence cannot alone produce an accurate localization of structures in the z-dimension, however, it provides greatly improved axial resolution for biological samples. Multiple angle-TIRF microscopy allows controlled variation of the incident angle of the illuminating laser beam, thus generating a set of images of different penetration depths with the potential to reconstruct the 3-D volume of the sample. With the ultimate goal to quantify important biological parameters of microtubules, we present a method to reconstruct 3-D position and orientation of microtubules based on multi-angle TIRF data, as well as experimental calibration of the actual decay function of the evanescent field at each angle after taking into consideration the effect of point spread function, quantum efficiency and photon collection efficiency.
Keywords :
biological techniques; cellular biophysics; fluorescence; image reconstruction; medical image processing; optical microscopy; 3D microtubule reconstruction; axial resolution; evanescent field decay function; evanescent field penetration depths; microtubule 3D orientation; microtubule 3D position; microtubule biological parameters; microtubule measurement; multiple angle TIRF microscopy; sample 3D volume reconstruction; thin evanescent field; total internal reflection fluorescence microscopy; Calibration; Fluorescence; Image reconstruction; Image resolution; Laser beams; Laser theory; Microscopy; Optical control; Optical reflection; Three dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition Workshops, 2009. CVPR Workshops 2009. IEEE Computer Society Conference on
Conference_Location :
Miami, FL
ISSN :
2160-7508
Print_ISBN :
978-1-4244-3994-2
Type :
conf
DOI :
10.1109/CVPRW.2009.5204056
Filename :
5204056
Link To Document :
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