DocumentCode :
296021
Title :
MLP classifiers: overtraining and solutions
Author :
Chi, Zheru
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Hung Hom, Hong Kong
Volume :
5
fYear :
1995
fDate :
Nov/Dec 1995
Firstpage :
2821
Abstract :
Training a multi-layer perceptron (MLP) classifier is difficult to control and as a result its performance on unseen patterns is unpredicted. Overtraining is one of many problems in training an MLP classifier. In this paper, the author first discusses the overtraining problem based on an artificial two-input two-category classification problem. The author then suggests five solutions to the overtraining problem, which are supported by experimental results
Keywords :
learning (artificial intelligence); multilayer perceptrons; pattern classification; multi-layer perceptron classifier; overtraining; two-input two-category classification problem; Degradation; Electronic mail; Multilayer perceptrons; Pattern recognition; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 1995. Proceedings., IEEE International Conference on
Conference_Location :
Perth, WA
Print_ISBN :
0-7803-2768-3
Type :
conf
DOI :
10.1109/ICNN.1995.488180
Filename :
488180
Link To Document :
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