Title :
MLP classifiers: overtraining and solutions
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Hung Hom, Hong Kong
Abstract :
Training a multi-layer perceptron (MLP) classifier is difficult to control and as a result its performance on unseen patterns is unpredicted. Overtraining is one of many problems in training an MLP classifier. In this paper, the author first discusses the overtraining problem based on an artificial two-input two-category classification problem. The author then suggests five solutions to the overtraining problem, which are supported by experimental results
Keywords :
learning (artificial intelligence); multilayer perceptrons; pattern classification; multi-layer perceptron classifier; overtraining; two-input two-category classification problem; Degradation; Electronic mail; Multilayer perceptrons; Pattern recognition; Testing;
Conference_Titel :
Neural Networks, 1995. Proceedings., IEEE International Conference on
Conference_Location :
Perth, WA
Print_ISBN :
0-7803-2768-3
DOI :
10.1109/ICNN.1995.488180