• DocumentCode
    2960214
  • Title

    Chip-level thermal simulator to predict VLSI chip temperature

  • Author

    Cheng, Yi-Kan ; Kang, Sung-Mo

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    30 Apr-3 May 1995
  • Firstpage
    1392
  • Abstract
    In this paper, a new thermal simulator is developed to predict the steady-state and transient temperatures inside a VLSI chip subjected to heating by single or multiple heat sources. It uses a mixed 3D finite-difference and 1D analogous thermal circuit method, taking into account any combination of boundary conditions, shape of heat sources, and packaging. An analytical method is also presented and compared to the numerical method. With this tool, the chip temperature can be predicted accurately to provide design guidelines for VLSI module placement and chip packaging
  • Keywords
    VLSI; circuit analysis computing; finite difference methods; integrated circuit modelling; integrated circuit packaging; temperature distribution; thermal analysis; 1D analogous thermal circuit method; 3D finite-difference method; VLSI chip temperature prediction; analytical method; chip packaging; chip-level thermal simulator; module placement; multiple heat sources; numerical method; single heat source; steady-state temperature; transient temperature; Boundary conditions; Circuit simulation; Finite difference methods; Heating; Packaging; Predictive models; Shape; Steady-state; Temperature; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-2570-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.1995.520407
  • Filename
    520407