• DocumentCode
    2960289
  • Title

    New methodology for modeling large scale manufacturing process: Using process mining methods and experts´ knowledge

  • Author

    Viale, Pamela ; Frydman, Claudia ; Pinaton, Jacques

  • Author_Institution
    Lab. des Sci. de l´´Inf. et des Syst., Univ. Aix-Marseille III, Marseille, France
  • fYear
    2011
  • fDate
    27-30 Dec. 2011
  • Firstpage
    84
  • Lastpage
    89
  • Abstract
    Modeling manufacturing process of complex products like electronic chips is crucial to maximize the quality of the production. This paper proposes a new methodology to model large scale manufacturing processes based on activity information as well as experts´ knowledge. DEVS formalism is used for the final models because of its advantages as a formal formalism. This methodology helps to easily detect discrepancies between the actual implementation of processes with experts´ definitions. It also helps to construct general models that could be used later for controlling processes. The idea of STMicroelectronics enterprise is to use these general models to implement an alarm system. The idea is to alert engineers about risky modifications done over STMicroelectronics manufacturing processes. The state of our work towards to model STMicroelectronics´ production processes is presented at the end of this paper.
  • Keywords
    alarm systems; data mining; integrated circuit manufacture; manufacturing processes; process control; product quality; production engineering computing; DEVS formalism; STMicroelectronics enterprise; STMicroelectronics manufacturing process; activity information; alarm system; complex product; electronic chips; expert knowledge; formal formalism; large scale manufacturing process modelling; process mining method; production process control; production quality; risky modification; Adaptation models; Alarm systems; Databases; Manufacturing processes; Process control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Systems and Applications (AICCSA), 2011 9th IEEE/ACS International Conference on
  • Conference_Location
    Sharm El-Sheikh
  • ISSN
    2161-5322
  • Print_ISBN
    978-1-4577-0475-8
  • Electronic_ISBN
    2161-5322
  • Type

    conf

  • DOI
    10.1109/AICCSA.2011.6126595
  • Filename
    6126595