Title :
Survival reliabilities of double loop networks
Author :
Hu, X.D. ; Hwang, F.K.
Author_Institution :
Rutgers Univ., New Brunswick, NJ, USA
Abstract :
A reliability model of double loop networks which assumes that each link independently has probability p to fail and that the network fails if and only if there exist two nodes u and v with every path from u and v containing a failed link is extended to the more difficult survival reliability model for both isolated and nonisolated cutsets. The survival reliability model assumes that every node independently has probability p to fail and that the network fails if and only if there exist two surviving nodes u and v with every path from u to v containing a failed node. It is shown that many results from the reliability model can be carried over to the survival reliability model, and that for even n, G(1, 1+n/2) is the most reliable double loop network in survival reliability. The reliability model is only extended to the nonisolated cases for a small number of cutsets
Keywords :
reliability; set theory; telecommunication networks; double loop networks; failure probability; isolated cutsets; nonisolated cutsets; reliability model; survival reliability model; Hydrogen; Sufficient conditions;
Conference_Titel :
Global Telecommunications Conference, 1990, and Exhibition. 'Communications: Connecting the Future', GLOBECOM '90., IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-87942-632-2
DOI :
10.1109/GLOCOM.1990.116593