DocumentCode :
2960344
Title :
Testing QCA Modular Logic
Author :
Sultana, Sayeeda ; Al Imam, Shahriar ; Radecka, Katarzyna
Author_Institution :
Concordia Univ., Montreal
fYear :
2006
fDate :
10-13 Dec. 2006
Firstpage :
700
Lastpage :
703
Abstract :
We propose a design for testability of arbitrary combinational quantum dot cellular automata (QCA) logic, which facilitates its functionality testing. Any combinational logic can be implemented using only AND-OR gates (with negated signals available), and in QCA this results in reduced test set. Previously this strategy was proposed for QCA testing considering only primary inputs (either true or complemented, but not both) feeding different majority voters, which fails for general circuits where fan-outs are allowed for primary inputs and their complement. In this paper we propose a design scheme that enables testing of any combinational QCA circuit.
Keywords :
cellular automata; combinational circuits; design for testability; logic gates; logic testing; quantum dots; AND-OR gates; arbitrary combinational QCA modular logic; design-for-testability; quantum dot cellular automata testing; CMOS technology; Circuit testing; Design for testability; Electrons; Inverters; Logic design; Logic devices; Logic testing; Quantum cellular automata; Quantum dots;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
Conference_Location :
Nice
Print_ISBN :
1-4244-0395-2
Electronic_ISBN :
1-4244-0395-2
Type :
conf
DOI :
10.1109/ICECS.2006.379885
Filename :
4263463
Link To Document :
بازگشت