DocumentCode
2960945
Title
Learning from testing data: A new view of incremental semi-supervised learning
Author
Cao, Yuan ; He, Haibo
Author_Institution
Dept. of Electr. & Comput. Eng., Stevens Inst. of Technol., Hoboken, NJ
fYear
2008
fDate
1-8 June 2008
Firstpage
2872
Lastpage
2878
Abstract
In this paper, we propose a novel method for incremental semi-supervised learning. Unlike the traditional way of incremental learning or semi-supervised learning, we try to answer a more challenging question: given inadequate labeled training data, can one use the unlabeled testing data to improve the learning and prediction accuracy? The objective here is to reinforce the learning system trained offline through online incremental semi-supervised learning based on the testing data distribution. To do this, we propose an iterative algorithm that can adaptively recover the labels for testing data based on their confidence levels, and then extend the training population by such recovered data to facilitate learning and prediction. Multiple hypotheses are developed based on different learning capabilities of different recovered data sets, and a voting method is used to integrate the decisions from different hypotheses for the final predicted labels. We compare the proposed algorithm with bootstrap aggregating (bagging) method for performance evaluation. Simulation results on various real-world data sets illustrate the effectiveness of the proposed method.
Keywords
iterative methods; learning (artificial intelligence); bagging method; bootstrap aggregating method; data confidence level; inadequate labeled training data; incremental semisupervised learning; iterative algorithm; performance evaluation; prediction accuracy; testing data distribution; voting method; Clustering algorithms; Data mining; Decision making; Helium; Intelligent sensors; Learning systems; Semisupervised learning; System testing; Training data; Voting;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location
Hong Kong
ISSN
1098-7576
Print_ISBN
978-1-4244-1820-6
Electronic_ISBN
1098-7576
Type
conf
DOI
10.1109/IJCNN.2008.4634202
Filename
4634202
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