Title :
Some issues of the critical ratio dispatch rule in semiconductor manufacturing
Author_Institution :
Inst. of Comput. Sci., Wurzburg Univ., Germany
Abstract :
In this paper, we examine the cycle time and on-time delivery performance of a semiconductor wafer fabrication facility (wafer fab) under critical ratio (CR) dispatch regime. It turns out that determining appropriate due dates for this rule is a critical task. We provide a detailed analysis of the wafer fab behavior for a large range of due date values. From the results of the experiments we develop an heuristic for conservative due date estimates.
Keywords :
dispatching; production control; semiconductor device manufacture; conservative due date estimates; critical ratio dispatch rule; cycle time; on-time delivery performance; semiconductor wafer fabrication facility; Chromium; Computer science; Electronics industry; Fabrication; Job shop scheduling; Production control; Semiconductor device manufacture; Semiconductor device packaging; Testing; Throughput;
Conference_Titel :
Simulation Conference, 2002. Proceedings of the Winter
Print_ISBN :
0-7803-7614-5
DOI :
10.1109/WSC.2002.1166410