• DocumentCode
    2962048
  • Title

    Rapid RTL-based signal ranking for FPGA prototyping

  • Author

    Wilton, Steven J. E. ; Quinton, B.R. ; Hung, Eddie

  • Author_Institution
    Tektronix Embedded Instrum. Group, Vancouver, BC, Canada
  • fYear
    2012
  • fDate
    10-12 Dec. 2012
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    As the capacity of integrated circuits increases, it is becoming increasingly difficult to ensure that a chip is free of design errors. Designers are increasingly turning to FPGA prototyping platforms to validate their designs much more extensively than is possible using simulation. A key challenge is one of visibility; signals can only be observed if they can be driven to pins of a chip. To enhance visibility during debug, designers regularly instrument their design with on-chip circuitry to record a small subset of signals at-speed for later off-chip analysis. The selection of which signals should be recorded critically affects the effectiveness of this approach. In this paper, we present an algorithm that ranks all signals in a design based on their predicted importance during validation. Compared to previous techniques, which analyze the circuit at the gate level, our algorithm works directly on the parse-tree representation of the circuit, and hence is orders of magnitude faster than these previous techniques. Our algorithm has been implemented as an integral part of Tektronix Certus, a commercial validation suite.
  • Keywords
    field programmable gate arrays; network analysis; FPGA prototyping platforms; Tektronix Certus; circuit analysis; off chip analysis; on chip circuitry; parse tree representation; rapid RTL based signal ranking; Algorithm design and analysis; Design automation; Field programmable gate arrays; Hardware design languages; Instruments; Integrated circuit modeling; Logic gates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field-Programmable Technology (FPT), 2012 International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4673-2846-3
  • Electronic_ISBN
    978-1-4673-2844-9
  • Type

    conf

  • DOI
    10.1109/FPT.2012.6412102
  • Filename
    6412102