DocumentCode :
2962079
Title :
A method for selecting and ranking quality metrics for optimization of biometric recognition systems
Author :
Schmid, Natalia A. ; Nicolo, Francesco
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
fYear :
2009
fDate :
20-25 June 2009
Firstpage :
126
Lastpage :
133
Abstract :
In the field of biometrics evaluation of quality of biometric samples has a number of important applications. The main applications include (1) to reject poor quality images during acquisition, (2) to use as enhancement metric, and (3) to apply as a weighting factor in fusion schemes. Since a biometric-based recognition system relies on measures of performance such as matching scores and recognition probability of error, it becomes intuitive that the metrics evaluating biometric sample quality have to be linked to the recognition performance of the system. The goal of this work is to design a method for evaluating and ranking various quality metrics applied to biometric images or signals based on their ability to predict recognition performance of a biometric recognition system. The proposed method involves: (1) Preprocessing algorithm operating on pairs of quality scores and generating relative scores, (2) Adaptive multivariate mapping relating quality scores and measures of recognition performance and (3) Ranking algorithm that selects the best combinations of quality measures. The performance of the method is demonstrated on face and iris biometric data.
Keywords :
biometrics (access control); face recognition; image matching; adaptive multivariate mapping relating quality scores; biometric recognition systems; biometric sample quality; face data; infusion schemes; iris biometric data; matching scores; poor quality images rejection; preprocessing algorithm; quality metrics; relative scores; weighting factor; Application software; Biometrics; Design methodology; Image coding; Image quality; Image recognition; Iris; Optimization methods; Signal design; Video compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition Workshops, 2009. CVPR Workshops 2009. IEEE Computer Society Conference on
Conference_Location :
Miami, FL
ISSN :
2160-7508
Print_ISBN :
978-1-4244-3994-2
Type :
conf
DOI :
10.1109/CVPRW.2009.5204309
Filename :
5204309
Link To Document :
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