Title :
Composition and structure of surfaces of silicon spheres used in determination of the Avogadro constant
Author :
Kenny, M.J. ; Netterfield, R.J. ; Wielunski, L.S. ; Beaglehole, D.
Author_Institution :
Dept. of Telecommun. & Ind. Phys., CSIRO, Lindfield, NSW, Australia
Abstract :
The Avogadro constant is required to be determined with an uncertainty of less than 1/spl times/10/sup -8/ in order to consider an atomic definition of the kilogram. A single crystal silicon sphere 93.6 mm diameter is used for this determination. Surface contaminants such as oxide and water must be taken into account. The nature of this contamination has been investigated using optical ellipsometry and ion beam analysis.
Keywords :
adsorption; constants; density measurement; ellipsometry; ion microprobe analysis; oxidation; silicon; surface composition; surface contamination; surface structure; 93.6 mm; Avogadro constant; Si; atomic definition; crystal orientation effect; ion beam analysis; kilogram; molar mass; optical ellipsometry; oxide thickness; single crystal silicon sphere; surface adsorption; surface composition; surface contaminants; surface structure; uncertainty; water vapour uptake; Atomic measurements; Communication industry; Ellipsometry; Etching; Humidity; Ion beams; Pollution measurement; Pressure measurement; Silicon; Thickness measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.700003
