DocumentCode
2962124
Title
Hidden-Markov model based sequential clustering for autonomous diagnostics
Author
Kumar, Akhilesh ; Tseng, Finn ; Guo, Yan ; Chinnam, Ratna Babu
Author_Institution
Ind. & Manuf. Eng. Dept., Wayne State Univ., Detroit, MI
fYear
2008
fDate
1-8 June 2008
Firstpage
3345
Lastpage
3351
Abstract
Despite considerable advances over the last few decades in sensing instrumentation and information technology infrastructure, monitoring and diagnostics technology has not yet found its place in health management of mainstream machinery and equipment. The fundamental reason for this being the mismatch between the growing diversity and complexity of machinery and equipment employed in industry and the historical reliance on ldquopoint-solutionrdquo diagnostic systems that necessitate extensive characterization of the failure modes and mechanisms (something very expensive and tedious). While these point solutions have a role to play, in particular for monitoring highly-critical assets, generic yet adaptive solutions, meaning solutions that are flexible and able to learn on-line, could facilitate large-scale deployment of diagnostic and prognostic technology. We present a novel approach for autonomous diagnostics that employs model-based sequential clustering with hidden-Markov models as a means for measuring similarity of time-series sensor signals. The proposed method has been tested on a CNC machining test-bed outfitted with thrust-force and torque sensors for monitoring drill-bits. Preliminary results revealed the competitive performance of the method.
Keywords
computerised numerical control; diagnostic expert systems; drilling machines; force sensors; hidden Markov models; maintenance engineering; production engineering computing; time series; unsupervised learning; CNC machining; autonomous diagnostics; drill-bits monitoring; hidden-Markov model; highly-critical assets monitoring; information technology infrastructure; mainstream machinery health management; model-based sequential clustering; sensing instrumentation; sequential clustering; time-series sensor signals; torque sensors; Computer numerical control; Condition monitoring; Information technology; Instruments; Large-scale systems; Machinery; Machining; Technology management; Testing; Torque;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location
Hong Kong
ISSN
1098-7576
Print_ISBN
978-1-4244-1820-6
Electronic_ISBN
1098-7576
Type
conf
DOI
10.1109/IJCNN.2008.4634273
Filename
4634273
Link To Document