• DocumentCode
    2962211
  • Title

    Robust feature matching in 2.3µs

  • Author

    Taylor, Simon ; Rosten, Edward ; Drummond, Tom

  • Author_Institution
    Dept. of Eng., Univ. of Cambridge, Cambridge, UK
  • fYear
    2009
  • fDate
    20-25 June 2009
  • Firstpage
    15
  • Lastpage
    22
  • Abstract
    In this paper we present a robust feature matching scheme in which features can be matched in 2.3 mus. For a typical task involving 150 features per image, this results in a processing time of 500 mus for feature extraction and matching. In order to achieve very fast matching we use simple features based on histograms of pixel intensities and an indexing scheme based on their joint distribution. The features are stored with a novel bit mask representation which requires only 44 bytes of memory per feature and allows computation of a dissimilarity score in 20 ns. A training phase gives the patch-based features invariance to small viewpoint variations. Larger viewpoint variations are handled by training entirely independent sets of features from different viewpoints. A complete system is presented where a database of around 13,000 features is used to robustly localise a single planar target in just over a millisecond, including all steps from feature detection to model fitting. The resulting system shows comparable robustness to SIFT and Ferns while using a tiny fraction of the processing time, and in the latter case a fraction of the memory as well.
  • Keywords
    database indexing; feature extraction; image matching; image representation; visual databases; bit mask representation; feature detection; image matching; indexing scheme; model fitting; robust feature matching scheme; Computer vision; Data mining; Feature extraction; Histograms; Image databases; Image edge detection; Indexing; Robustness; Runtime; Spatial databases;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops, 2009. CVPR Workshops 2009. IEEE Computer Society Conference on
  • Conference_Location
    Miami, FL
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-3994-2
  • Electronic_ISBN
    2160-7508
  • Type

    conf

  • DOI
    10.1109/CVPRW.2009.5204314
  • Filename
    5204314