DocumentCode :
2962234
Title :
Peak noise prediction in loosely coupled interconnect [VLSI circuits]
Author :
Tang, Kevin T. ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
Volume :
1
fYear :
1999
fDate :
36342
Firstpage :
541
Abstract :
Interconnect in VLSI circuits is best modeled as a lossy transmission line in high speed integrated circuits. Analytical expressions for the coupling noise between adjacent interconnect are presented to estimate the peak noise voltage on a quiet line based on the assumption that these interconnections are loosely coupled, where the effect of the coupling noise on the waveform of an active line is small. These closed form expressions are also applied to the condition of a varying load impedance. The estimated error of the peak noise amplitude at the near end of the quiet line is less than 15% under high loss and non-matching load conditions
Keywords :
VLSI; coupled transmission lines; digital integrated circuits; electric impedance; high-speed integrated circuits; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; transmission line theory; VLSI circuits; closed form expressions; coupling noise; high loss conditions; high speed integrated circuits; interconnect modelling; loosely coupled interconnect; lossy transmission line; nonmatching load conditions; peak noise prediction; peak noise voltage; varying load impedance; Active noise reduction; Circuit analysis; Coupling circuits; Distributed parameter circuits; High speed integrated circuits; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit noise; Propagation losses; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5471-0
Type :
conf
DOI :
10.1109/ISCAS.1999.777948
Filename :
777948
Link To Document :
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