• DocumentCode
    2962338
  • Title

    GIMADS diagnostics allocation process

  • Author

    Clothier, Richard H. ; Nguyen, Huan T.

  • Author_Institution
    Gen. Dynamics, Ft. Worth, TX, USA
  • fYear
    1989
  • fDate
    22-26 May 1989
  • Firstpage
    1339
  • Abstract
    Generic Integrated Maintenance Diagnostics (GIMADS) is a US Air Force and industry cooperative program whose prime objective is to develop and institutionalize a system-engineering, time-phased process for integrated diagnostics that meets the operational needs of the weapon system. The authors address some of the current approaches to tailoring the diagnostic requirements and then allocating them to equipment in a manner in which the design engineer can understand what is needed without being restricted as to how it is to be integrated into the total design. Consideration is also given to the verification of diagnostic design requirements and the maturation process. The GIMADS approach assures total diagnostic coverage at each design level and provides the optimum partitioning of embedded and external diagnostic equipment. The diagnostic allocation process also specifies the optimum diagnostic mix and requirements to assure that operational, safety, and maintenance needs are met. A proper design results in minimal life-cycle costs while meeting the operational and mission requirements
  • Keywords
    automatic testing; design engineering; military computing; GIMADS; Generic Integrated Maintenance Diagnostics; US Air Force; USAF; diagnostic requirements; diagnostics allocation process; industry cooperative program; integrated diagnostics; life-cycle costs; mission requirements; total diagnostic coverage; verification of diagnostic design requirements; Availability; Cost function; Defense industry; Design engineering; Government; Product safety; Reliability engineering; System testing; Systems engineering and theory; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1989.40384
  • Filename
    40384