DocumentCode :
2962843
Title :
Highly reliable and power efficient NOC interconnects
Author :
Zamzam, D.M. ; Abd El Ghany, Mohamed A. ; Hofmann, Klaus ; Ismail, Mohammad
Author_Institution :
Commun. Eng. Dept., German Univ. in Cairo, Cairo, Egypt
fYear :
2011
fDate :
14-15 Nov. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Network on chip (NOC) architecture interconnects consume significant amount of power, have a large propagation delay and are susceptible to error due to deep sub-micron (DSM) noise. Major challenge that NOC design expected to face is related to intrinsic reliability. By incorporating error control coding schemes along the NOC interconnects, NOC architectures are able to provide correct functionality in the presence of different transient noise source. In this paper we present a novel coding scheme that increase the reliability of the NOC where the area is reduced by 19% and the consumed power by NOC interconnects is decreased by 51%. Butterfly fat tree architecture consumes the minimum power as compared to other NOC architectures.
Keywords :
error correction codes; error detection codes; integrated circuit design; integrated circuit interconnections; integrated circuit reliability; low-power electronics; network-on-chip; NOC interconnect; NOC reliability; butterfly fat tree architecture; deep submicron noise; error control coding scheme; network on chip architecture interconnect; network on chip design; transient noise source; Decoding; Electromagnetic scattering; Electromagnetics; Encoding; Lead; Logic gates; Wires; Error Control Coding; Interconnects; Network on Chip; Power Efficient; Reliable;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
NORCHIP, 2011
Conference_Location :
Lund
Print_ISBN :
978-1-4577-0514-4
Electronic_ISBN :
978-1-4577-0515-1
Type :
conf
DOI :
10.1109/NORCHP.2011.6126732
Filename :
6126732
Link To Document :
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